By Nikolos D.   Hayes J.P.   Nicolaidis M.   Metra C.   in Journal of Electronic Testing

ISSN:0923-8174|18|3|259-260

Springer Publishing Company ‎(2002)‎

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By Vergos H. T.   Tsiatouhas Y.   Haniotakis Th.   Nikolos D.   Nicolaidis M.   in International Journal of Electronics

ISSN:1362-3060|88|8|923-937

Taylor & Francis Ltd‎(2001)‎

Access to resources Favorite 5.7469816