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By Osawa T.   Ishida2 K.   Onodera1 M.   Feng1 X-Y.   Hayashi2 S.   Nozaka1 Y.   in Journal of Electron Microscopy

ISSN:0022-0744|51|3|195-197

Oxford University Press‎(2002)‎

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By Osawa T.   Ishida2 K.   Onodera1 M.   Feng1 X-Y.   Hayashi2 S.   Nozaka1 Y.   in Journal of Electron Microscopy

ISSN:0022-0744|51|5|341-345

Oxford University Press‎(2002)‎

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Total 2 item(s)