By Simoen E   Federico A   Aoulaiche M   Ritzenthaler R   Schram T   Arimura H   Cho M   Kauerauf T   Groeseneken G   Horiguchi N   Thean A   Crupi F   Spessot A   Caillat C   Fazan P   Na H-J   Son Y   Noh K B   in Semiconductor Science and Technology

ISSN:0268-1242|29|11|115015-115022

IOP Publishing‎(2014)‎

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