By Zhou Z J   Rufer L   Salze E   Yuldashev P   Ollivier S   Wong M   in Journal of Micromechanics and Microengineering

ISSN:0960-1317|23|10|105006-105015

IOP Publishing‎(2013)‎

Access to resources Favorite 6.466774

By Rufer L.   in Journal of Electronic Testing

ISSN:0923-8174|21|3|233-241

Springer Publishing Company ‎(2005)‎

Access to resources Favorite 4.108064