By Kumar S Sanjeev   Kumar M Ramesh   Sudheendra H N   Sathish R   in Insight - Non-Destructive Testing and Condition Monitoring

ISSN:1354-2575|53|6|312-315

The British Institute of Non-Destructive Testing‎(2011)‎

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By Sathish R.   Anand G.   in Journal of VLSI Signal Processing

ISSN:0922-5773|45|1-2|29-48

Springer Publishing Company ‎(2006)‎

Access to resources Favorite 3.0051801

By Sathish R. Sai   Sairam S.   Raja V. Guru   Rao G. Nageswara   Janardhana C.   in Separation Science and Technology

ISSN:0149-6395|43|14|3676-3694

Taylor & Francis Ltd‎(2008)‎

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By Sathish R. Sai   Raju N. S. R.   Raju G. S.   Rao G. Nageswara   Kumar K. Anil   Janardhana C.   in Separation Science and Technology

ISSN:0149-6395|42|4|769-788

Taylor & Francis Ltd‎(2007)‎

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