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ISSN:1569-3937|15|10|1303-1317

Taylor & Francis Ltd‎(2001)‎

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By Meneghesso G.   Levada S.   Zanoni E.   Scamarcio G.   Mura G.   Podda S.   Vanzi M.   Du S.   Eliashevich I.   in Microelectronics Reliability

ISSN:0026-2714|43|9|1737-1742

Elsevier‎(2003)‎

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