By Röhker Karin   Rienitz Olaf   Schiel Detlef   in Accreditation and Quality Assurance

ISSN:0949-1775|9|11-12|671-677

Springer Publishing Company ‎(2004)‎

Access to resources Favorite 12.798185

By Werhahn Olav   Ortwein Pascal   Schiel Detlef   Ebert Volker   Nwaboh Javis A   in Measurement Science and Technology

ISSN:0957-0233|24|1|15202-15213

IOP Publishing‎(2013)‎

Access to resources Favorite 10.665154