By Card H.C.   McNeill D.K.   Schneider C.R.   in Analog Integrated Circuits and Signal Processing

ISSN:0925-1030|15|3|291-314

Springer Publishing Company ‎(1998)‎

Access to resources Favorite 9.426632

By Georgiou G A   Schneider C R A   in Insight - Non-Destructive Testing and Condition Monitoring

ISSN:1354-2575|47|5|293-296

The British Institute of Non-Destructive Testing‎(2005)‎

Access to resources Favorite 4.1903844

By Schneider C R A   Georgiou G A   in Insight - Non-Destructive Testing and Condition Monitoring

ISSN:1354-2575|47|2|95-97

The British Institute of Non-Destructive Testing‎(2005)‎

Access to resources Favorite 4.1903844

By Georgiou G A   Schneider C R A   in Insight - Non-Destructive Testing and Condition Monitoring

ISSN:1354-2575|45|2|116-118

The British Institute of Non-Destructive Testing‎(2003)‎

Access to resources Favorite 4.1903844

By Schneider C R A   Rudlin J R   in Insight - Non-Destructive Testing and Condition Monitoring

ISSN:1354-2575|46|2|77-79

The British Institute of Non-Destructive Testing‎(2004)‎

Access to resources Favorite 4.1903844

By Schneider C R A   Georgiou G A   in Insight - Non-Destructive Testing and Condition Monitoring

ISSN:1354-2575|45|2|119-121

The British Institute of Non-Destructive Testing‎(2003)‎

Access to resources Favorite 4.1903844

By Nageswaran C   Schneider C R A   Bird C R   in Insight - Non-Destructive Testing and Condition Monitoring

ISSN:1354-2575|50|5|258-263

The British Institute of Non-Destructive Testing‎(2008)‎

Access to resources Favorite 3.491987

By Shipp R   Schneider C R A   Bird C R   Wood D A   in Insight - Non-Destructive Testing and Condition Monitoring

ISSN:1354-2575|45|2|122-124

The British Institute of Non-Destructive Testing‎(2003)‎

Access to resources Favorite 2.7935896