By Sigle W.   Zhang Z.   in Philosophical Magazine Letters

ISSN:1362-3036|83|12|711-719

Taylor & Francis Ltd‎(2003)‎

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By Sigle W.   Redlich P.   in Philosophical Magazine Letters

ISSN:1362-3036|76|3|125-132

Taylor & Francis Ltd‎(1997)‎

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By Sigle W.   Chang L.-S.   Gust W.   in Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties

ISSN:0141-8610|82|8|1595-1608

Taylor & Francis Ltd‎(2002)‎

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By Niwase K.   Sigle W.   Phillipp F.   Seeger A.   in Philosophical Magazine Letters

ISSN:1362-3036|74|3|167-174

Taylor & Francis Ltd‎(1996)‎

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By Sigle W.   Zern A.   Hahn K.   Eigenthaler U.   Rühle M.   in Journal of Electron Microscopy

ISSN:0022-0744|50|6|509-515

Oxford University Press‎(2002)‎

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By Barth K.-L.   Sigle W.   Stockle D.   Ulmer J.   Lunk A.   in Thin Solid Films

ISSN:0040-6090|301|1|65-70

Elsevier‎(1997)‎

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By Sigle W.   Kramer S.   Varshney V.   Zern A.   Eigenthaler U.   Ruhle M.   in Ultramicroscopy

ISSN:0304-3991|96|3|565-571

Elsevier‎(2003)‎

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By van Benthem K.   French R.H.   Sigle W.   Elsasser C.   Ruhle M.   in Ultramicroscopy

ISSN:0304-3991|86|3|303-318

Elsevier‎(2001)‎

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By Cai Y.   Zimmermann A.   Prinz S.   Krämer S.   Philipp F.   Sigle W.   Aldinger F.   in Philosophical Magazine Letters

ISSN:1362-3036|82|10|553-558

Taylor & Francis Ltd‎(2002)‎

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By Sigle W   in Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties

ISSN:0141-8610|79|5|1009-1020

Taylor & Francis Ltd‎(1999)‎

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