By Hernández C.   Tutsch R.   in International Journal of Metrology and Quality Engineering

ISSN:2107-6839|3|3|151-154

Edp Sciences‎(2013)‎

Access to resources Favorite 11.1821375

By Hesselbach J.   Tutsch R.   Büttgenbach S.   Pokar G.   Bütefisch S.   Berndt M.   in Microsystem Technologies

ISSN:0946-7076|10|3|182-186

Springer Publishing Company ‎(2004)‎

Access to resources Favorite 6.000471