By Ooi Keng Boon   Bakar Nooh Abu   Arumugam Veeri   Vellapan Lorraine   Loke Alex Kim Yin   in International Journal of Quality & Reliability Management

ISSN:0265-671X|24|1|62-77

Emerald Group Publishing Ltd‎(2007)‎

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By Ooi Keng Boon   Veeri Arumugam   Yin Loke Kim   Vellapan Lorraine Subathra   in The TQM Magazine

ISSN:0954-478X|18|5|528-541

Emerald Group Publishing Ltd‎(2006)‎

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