By Sanchez P   Zamarreño C R   Hernaez M   Villar I Del   Fernandez-Valdivielso C   Matias I R   Arregui F J   in Measurement Science and Technology

ISSN:0957-0233|23|1|14002-14007

IOP Publishing‎(2012)‎

Access to resources Favorite 7.098485