By Öksüzoglu1 *- R.M.   Weirich T.E.   Fuess H.   in Journal of Electron Microscopy

ISSN:0022-0744|52|2|91-100

Oxford University Press‎(2003)‎

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By Weirich T.E.   Winterer M.   Seifried S.   Hahn H.   Fuess H.   in Ultramicroscopy

ISSN:0304-3991|81|3|263-270

Elsevier‎(2000)‎

Access to resources Favorite 9.723477

By Weirich T. E.   Reinholdt A.   Kreibig U.   Mayer J.   in Materials Science and Technology

ISSN:1743-2847|24|6|667-674

Maney Publishing‎(2008)‎

Access to resources Favorite 4.024187