By Wilhite Patrick   Vyas Anshul A   Tan Jason   Tan Jasper   Yamada Toshishige   Wang Phillip   Park Jeongwon   Yang Cary Y   in Semiconductor Science and Technology

ISSN:0268-1242|29|5|54006-54021

IOP Publishing‎(2014)‎

Access to resources Favorite 6.796448

Hot-Carrier Effects in MOS Devices‎

By Takeda   Eiji;Yang   Cary Y.;Miura-Hamada   Akemi  

ISBN:9780080926223

Elsevier Science‎(1995)‎

Access to resources Favorite 2.564871