By Zhiming Li   Hailing Li   Xiaobing Gan   Haiying Jiang   Jinping Li   Xiaoqian Fu   Yanbin Han   Yingjie Xia   Jianqin Yin   Yimei Huang   Shigang Hu   in Journal of Semiconductors

ISSN:1674-4926|35|9|92003-92007

IOP Publishing‎(2014)‎

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