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Elsevier‎(2003)‎

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By Meneghesso G.   Levada S.   Zanoni E.   Scamarcio G.   Mura G.   Podda S.   Vanzi M.   Du S.   Eliashevich I.   in Microelectronics Reliability

ISSN:0026-2714|43|9|1737-1742

Elsevier‎(2003)‎

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By Salviati G.   Rossi F.   Armani N.   Pavesi M.   Manfredi M.   Meneghesso G.   Zanoni E.   Castaldini A.   Cavallini A.   in EPJ Applied Physics (The)

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Edp Sciences‎(2010)‎

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