Author： Zaytouni M. Riviere J.P.
Publisher： Elsevier
ISSN： 0043-1648
Source： Wear, Vol.197, Iss.1, 1996-09, pp. : 56-62
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Structural characterization of SiC films prepared by dynamic ion mixing
By Zaytouni M. Riviere J.P. Denanot M.F. Allain J.
Thin Solid Films, Vol. 287, Iss. 1, 1996-10 ,pp. :
Access to resources
Recommend
Investigation of ion beam mixing effects in Ta/Pd bilayers deposited on Si
By Bibic N. Milosavljevic M. Perusko D. Jeynes C.
Thin Solid Films, Vol. 317, Iss. 1, 1998-04 ,pp. :
Static and Dynamic Characteristics of SiC MOSFETs and SBDs for 3.3 kV 400 A Full SiC Modules
Materials Science Forum, Vol. 2015, Iss. 821, 2015-07 ,pp. :
By Kumar N. Dash S. Rajagopalan S. Bahuguna Ashok Tyagi A.K. Raj Baldev
Philosophical Magazine Letters, Vol. 91, Iss. 7, 2011-07 ,pp. :