Polarization effect in scanning near-field optic/atomic-force microscopy (SNOM/AFM)

By Nakajima K.   Mitsuoka Y.   Chiba N.   Muramatsu H.   Ataka T.   Sato K.   Fujihira M.  

Ultramicroscopy, Vol. 71, Iss. 1, 1998-03 ,pp. : 257-262

Elsevier

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Scanning near-field optical microscopy of fluorescent polystyrene spheres with a combined SNOM and AFM

By Fujihira M.   Monobe H.   Yamamoto N.   Muramatsu H.   Chiba N.   Nakajima K.   Ataka T.  

Ultramicroscopy, Vol. 61, Iss. 1, 1995-12 ,pp. : 271-277

Elsevier

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Electric-field-induced phase transitions in co-doped Pb(Zr1−xTix)O3 at the morphotropic phase boundary

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Science and Technology of Advanced Materials, Vol. 15, Iss. 1, 2014-02 ,pp. : 241-251

IOP Publishing

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Multi-functional SNOM/AFM probe with accurately controlled low spring constant

By Muramatsu H.   Chiba N.   Yamamoto N.   Homma K.   Ataka T.   Shigeno M.   Monobe H.   Fujihira M.  

Ultramicroscopy, Vol. 71, Iss. 1, 1998-03 ,pp. : 73-79

Elsevier

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Near-field, far-field and imaging properties of the 2D aperture SNOM

By Novotny L.   Pohl D.W.   Regli P.  

Ultramicroscopy, Vol. 57, Iss. 2, 1995-02 ,pp. : 180-188

Elsevier

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