Surface modification of an organosilane self-assembled monolayer on silicon substrates using atomic force microscopy: scanning probe electrochemistry toward nanolithography

Author: Sugimura H.   Hanji T.   Hayashi K.   Takai O.  

Publisher: Elsevier

ISSN: 0304-3991

Source: Ultramicroscopy, Vol.91, Iss.1, 2002-05, pp. : 221-226

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Abstract