Surface modification of an organosilane self-assembled monolayer on silicon substrates using atomic force microscopy: scanning probe electrochemistry toward nanolithography

Author： Sugimura H.   Hanji T.   Hayashi K.   Takai O.  

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.91, Iss.1, 2002-05, pp. : 221-226

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