Polarity determination of III-V compound semiconductors by large-angle convergent beam electron diffraction

Author： Jager C. Spiecker E. Morniroli J.P. Jager W.

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.92, Iss.3, 2002-08, pp. : 273-283

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