Author： Khursheed A.
Publisher： Elsevier
ISSN： 0304-3991
Source： Ultramicroscopy, Vol.93, Iss.3, 2002-12, pp. : 331-338
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Initial resolution measurements of miniaturized electrostatic lenses for LVSEM
Ultramicroscopy, Vol. 93, Iss. 3, 2002-12 ,pp. :
Access to resources
Recommend
Low-energy foil aberration corrector
By van Aken R.H. Hagen C.W. Barth J.E. Kruit P.
Ultramicroscopy, Vol. 93, Iss. 3, 2002-12 ,pp. :
Simulation methods for multipole imaging systems and aberration correctors
By Liu H. Munro E. Rouse J. Zhu X.
Ultramicroscopy, Vol. 93, Iss. 3, 2002-12 ,pp. :
Aberration correction results in the IBM STEM instrument
By Batson P.E.
Ultramicroscopy, Vol. 96, Iss. 3, 2003-09 ,pp. :