About the Measurements of the d 33 Piezoelectric Coefficient of the PZT Film--Si/SiO 2 /Ti/Pt Substrates Using an Optical Cryostat

Author： Nosek J.  

Publisher： Taylor & Francis Ltd

ISSN： 0015-0193

Source： Ferroelectrics, Vol.292, Iss.1, 2003-01, pp. : 103-109

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