Spectroscopic ellipsometry investigations of the optical constants of nanocrystalline SnS thin films

By Shaaban E.R.   El-Sadek M S Abd   El-Hagary M.   Yahia I.S.  

Physica Scripta, Vol. 86, Iss. 1, 2012-07 ,pp. : 15702-15707

IOP Publishing

Access to resources Recommend Favorite

Optical Properties of Barium Strontium Titanate (BST) Ferroelectric Thin Films

By Bain A. K.   Jackson T. J.   Koutsonas Yiannis   Cryan M.   Yu S.   Hill M.   Varrazza R.   Rorison J.   Lancaster M. J.  

Ferroelectrics Letters Section, Vol. 34, Iss. 5-6, 2007-09 ,pp. : 149-154

Taylor & Francis Ltd

Access to resources Recommend Favorite

Surface topography and optical properties of Ge-Sb(As)-S-Te thin films by atomic-force microscopy and variable angle spectroscopic ellipsometry

By  

Journal of Physics: Conference Series , Vol. 356, Iss. 1, 2012-03 ,pp. : 86-89

IOP Publishing

Access to resources Recommend Favorite

Analysis of the optical and structural properties of oxide films on InP using spectroscopic ellipsometry

By Shvets V.   Rykhlitskii S.   Mittova I.   Tomina E.  

Technical Physics, Vol. 58, Iss. 11, 2013-11 ,pp. : 1638-1645

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite

Determination of the Optical Properties of Sol-Gel-Derived Pb(Zr_xTi_{(1 − x)})O₃ Thin Films by Spectroscopic Ellipsometry

By Yang Shenghong   Mo Dang   Tang Xinggui  

Ferroelectrics, Vol. 287, Iss. 1, 2003-06 ,pp. : 35-46

Taylor & Francis Ltd

Access to resources Recommend Favorite