Domain and Microstructural Characterization of Ferroelectric Materials Using Transmission Electron Microscopy

Author: Chou Chen-Chia  

Publisher: Taylor & Francis Ltd

ISSN: 0015-0193

Source: Ferroelectrics, Vol.380, Iss.1, 2009-01, pp. : 141-149

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract