Reliability and Quality Upgrade on High Cap. MLCC by Extended Ionic Diffusion Path Technique

Author: Tsai T. L.   Sawasaki A.   Tsai Jeff   Shiao F. T.  

Publisher: Taylor & Francis Ltd

ISSN: 0015-0193

Source: Ferroelectrics, Vol.381, Iss.1, 2009-01, pp. : 9-16

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract