Charge-density determination in TiAl-Cr and TiAl-V using quantitative convergent-beam electron diffraction

Author: Holmestad R.   Birkeland C. R.  

Publisher: Taylor & Francis Ltd

ISSN: 0141-8610

Source: Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol.77, Iss.5, 1998-05, pp. : 1231-1254

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