Interfacial dislocations at the junction lines of {211} microfacets of a twin boundary in silicon

Author: Komninou Ph.   Dimitrakopulos G. P.  

Publisher: Taylor & Francis Ltd

ISSN: 0141-8610

Source: Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol.78, Iss.2, 1998-08, pp. : 255-272

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Abstract