Electron-energy-loss spectroscopy studies of Cu- alpha-Al2O3 interfaces grown by molecular beam epitaxy

Author: Scheu C.   Dehm G.   Ruhle M.  

Publisher: Taylor & Francis Ltd

ISSN: 0141-8610

Source: Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol.78, Iss.2, 1998-08, pp. : 439-465

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Abstract