Author： Mancini L. Reinier E. Cloetens P. Gastaldi J. Hartwig J. Schlenker M. Baruchel J.
Publisher： Taylor & Francis Ltd
ISSN： 0141-8610
Source： Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol.78, Iss.5, 1998-11, pp. : 1175-1194
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Abstract
Phase-sensitive radiography, made possible by the lateral coherence of the beams from third-generation synchrotron-radiation sources, has been combined with monochromatic X-ray topography in an investigation of structural defects and inhomogeneities in the bulk of Al-Pd-Mn icosahedral single quasicrystal grains. Loop-shaped defects previously observed by X-ray topography are thus related with holes and second phase precipitates revealed by phase radiography. The evolution of these defects after annealing provides clues on their nature and formation.
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