Analysis of misfit relaxation in heteroepitaxial BaTiO 3 thin films

Author: Suzuki Toshimasa   Nishi Yuji   Fujimoto Masayuki  

Publisher: Taylor & Francis Ltd

ISSN: 0141-8610

Source: Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol.79, Iss.10, 1999-10, pp. : 2461-2483

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Abstract