Author: Palmer M. A. Glicksman M. E. Rajan K.
Publisher: Taylor & Francis Ltd
ISSN: 0141-8610
Source: Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol.79, Iss.4, 1999-04, pp. : 763-774
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
The nucleation, growth, structure and epitaxy of thin surface films
By Pashley D.W.
Advances In Physics, Vol. 14, Iss. 55, 1965-07 ,pp. :
TEM annealing study of normal grain growth in silver thin films
By Dannenberg R. Stach E. Groza J.R. Dresser B.J.
Thin Solid Films, Vol. 379, Iss. 1, 2000-12 ,pp. :
Abnormal grain growth in {111} textured Cu thin films
Thin Solid Films, Vol. 418, Iss. 2, 2002-10 ,pp. :