Author: Edwards A. Bryan Roberts Kevin J. Pizzini Stefania Phythian William J.
Publisher: Taylor & Francis Ltd
ISSN: 0141-8610
Source: Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol.79, Iss.6, 1999-06, pp. : 1295-1319
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
By Sadoc A. Kim J. Y. Kelton K. F.
Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol. 81, Iss. 12, 2001-12 ,pp. :
Structural study of Ni 80 Fe 20 /Cu multilayers by X-ray diffraction
By Xu M. Chai C. Luo G. Yang T. Mai Z. Lai W.
Thin Solid Films, Vol. 375, Iss. 1, 2000-10 ,pp. :
EUROPEAN JOURNAL OF INORGANIC CHEMISTRY (ELECTRONIC), Vol. 2015, Iss. 16, 2015-06 ,pp. :