Estimating grain-size distributions in nanocrystalline materials from X-ray diffraction profile analysis

By Krill C. E.   Birringer R.  

Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol. 77, Iss. 3, 1998-03 ,pp. : 621-640

Taylor & Francis Ltd

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Comparison of standard‐based and standardless methods of quantification used in X‐ray fluorescence analysis: Application to the exoskeleton of clams

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X-RAY SPECTROMETRY, Vol. 47, Iss. 2, 2018-03 ,pp. : 108-115

John Wiley & Sons Inc

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Strain analysis by X-ray diffraction

By Fewster P.F.   Andrew N.L.  

Thin Solid Films, Vol. 319, Iss. 1, 1998-04 ,pp. : 1-8

Elsevier

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Shape, size, strain and correlations in quantum dot systems studied by grazing incidence X-ray scattering methods

By Metzger T.H.   Kegel I.   Paniago R.   Lorke A.   Peisl J.   Schulze J.   Eisele I.   Schittenhelm P.   Abstreiter G.  

Thin Solid Films, Vol. 336, Iss. 1, 1998-12 ,pp. : 1-8

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Method for Determining Crystal Grain Size by X‐Ray Diffraction

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CRYSTAL RESEARCH AND TECHNOLOGY (ELECTRONIC), Vol. 53, Iss. 2, 2018-02 ,pp. : n/a-n/a

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