High-resolution transmission electron microscopy imaging of misfit-dislocation networks at Cu-MgO and Cu-MnO interfaces

Author: Groen H. B.   Kooi B. J.   Vellinga W .P.   Dehosson J. Th. M.  

Publisher: Taylor & Francis Ltd

ISSN: 0141-8610

Source: Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol.79, Iss.9, 1999-09, pp. : 2083-2101

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