In-situ transmission electron microscopy study of ion-irradiated copper: temperature dependence of defect

Author: Daulton T. L.   Kirk M. A.   Rehn L. E.  

Publisher: Taylor & Francis Ltd

ISSN: 0141-8610

Source: Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol.80, Iss.4, 2000-04, pp. : 809-842

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