The microstructural development of Ag/Ni multilayers during annealing

Author: Schweitz K. O.   Ratzke K.   Foord D.   Thomas P. J.   Greer A. L.   Geisler H.   Chevallier J.   Bottiger J.  

Publisher: Taylor & Francis Ltd

ISSN: 0141-8610

Source: Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol.80, Iss.8, 2000-08, pp. : 1867-1877

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content