Interfacial microstructures of rf-sputtered TiNi shape memory alloy thin films on (100) silicon

Author： Wu S.K. Chen J.Z. Wu Y.J. Wang J.Y. Yu M.N. Chen F.R. Kai J.J.

ISSN： 0141-8610

Source： Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol.81, Iss.8, 2001-08, pp. : 1939-1949

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