Effect of Sputtering Parameters on the Magnetic Properties of SmCo 5 /Cu Films

Author: Cheng Weiming   Hu Hao   Dai Yifan   Cheng Xiaomin   Miao Xiangshui  

Publisher: Taylor & Francis Ltd

ISSN: 1042-6914

Source: Materials and Manufacturing Processes, Vol.28, Iss.5, 2013-05, pp. : 505-508

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Abstract

SmCo5 film is an emerging candidate for the recording material of future high density magnetic recording because of its huge uniaxial magneto-crystalline anisotropy. In this article, SmCo5 films were fabricated by radio frequency (RF) magnetron sputtering system onto quartz glass substrate, and a Cu underlayer was proposed in order to improve magnetic properties of SmCo5 films. The dependences of sputtering power, thickness and annealing temperature on the magnetic properties of SmCo5/Cu films were studied. Using the optimal sputtering parameters of sputtering power of 60 w, thickness of 65 nm, and annealing temperature of 650°C, the coercivity of SmCo5/Cu films is improved significantly.