Determining the accuracy of TLM in simulating the behaviour of resonant cavities with arbitrary dielectric loading

Author： Williams A. J. M.   Benson T. M.   Duffy A. P.  

Publisher： Taylor & Francis Ltd

ISSN： 1362-3060

Source： International Journal of Electronics, Vol.83, Iss.5, 1997-11, pp. : 645-660

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