Fast power cycling test for insulated gate bipolar transistor modules in traction application

Author： Held M.   Jacob P.   Nicoletti G.   Scacco P.   Poech M.-H.  

Publisher： Taylor & Francis Ltd

ISSN： 1362-3060

Source： International Journal of Electronics, Vol.86, Iss.10, 1999-10, pp. : 1193-1204

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