Path delay fault testing of multiplexer-based shifters

Author: Vergos H. T.   Tsiatouhas Y.   Haniotakis Th.   Nikolos D.   Nicolaidis M.  

Publisher: Taylor & Francis Ltd

ISSN: 1362-3060

Source: International Journal of Electronics, Vol.88, Iss.8, 2001-08, pp. : 923-937

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Abstract