Universal and robust testing of stuck-open faults in Reed-Muller canonical CMOS circuits

Author： Das Debesh K.   Chakraborty Susanta   Bhattacharya Bhargab B.  

Publisher： Taylor & Francis Ltd

ISSN： 1362-3060

Source： International Journal of Electronics, Vol.90, Iss.1, 2003-01, pp. : 1-11

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