![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Author: Tan Yanghong
Publisher: Taylor & Francis Ltd
ISSN: 1362-3060
Source: International Journal of Electronics, Vol.98, Iss.2, 2011-02, pp. : 173-183
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Fault Diagnosis for Linear Analog Circuits
By Lin J.W.
Journal of Electronic Testing, Vol. 17, Iss. 6, 2001-12 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)