

Author: Champagnon B. Chemarin C. Richet P.
Publisher: Taylor & Francis Ltd
ISSN: 1463-6417
Source: Philosophical Magazine B, Vol.77, Iss.2, 1998-02, pp. : 663-669
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content






Raman scattering investigation of the boson peak in a sodium silicate glass
Philosophical Magazine, Vol. 91, Iss. 13-15, 2011-05 ,pp. :


Heat capacity of CuO in the temperature range of 298.15-1300 K
By Leitner J. Sedmidubsky D. Dousova B. Strejc A. Nevriva M.
Thermochimica Acta, Vol. 348, Iss. 1, 2000-04 ,pp. :


IEEJ TRANSACTIONS ON ELECTRICAL AND ELECTRONIC ENGINEERING, Vol. 1931-4973, Iss. 6, 2015-11 ,pp. :