Temperature dependence of the density fluctuations of silica by small-angle X-ray scattering

Author: Le Parc R.   Champagnon B.   David L.   Faivre A.   Levelut C.   Guenot Ph.   Hazemann J. L.   Rochas C.   Simon J. P.  

Publisher: Taylor & Francis Ltd

ISSN: 1463-6417

Source: Philosophical Magazine B, Vol.82, Iss.4, 2002-03, pp. : 431-438

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Abstract