Author: Liu J. Zhang S. J. Chen Y. S.
Publisher: Taylor & Francis Ltd
ISSN: 1521-0626
Source: Numerical Heat Transfer Part B: Fundamentals, Vol.44, Iss.4, 2003-10, pp. : 329-345
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Measuring and interpreting the lifetime of silicon wafers
Solar Energy, Vol. 76, Iss. 1, 2004-01 ,pp. :
Degradation of silicon wafers at high temperatures for epitaxial deposition
Energy Science & Engineering, Vol. 4, Iss. 5, 2016-11 ,pp. :
By Babaee Hessam Acharya Sumanta
Numerical Heat Transfer Part B: Fundamentals, Vol. 65, Iss. 1, 2014-01 ,pp. :