Scanning electron microscopy study of failure in glass-sealed SiC/SiC-based composite (NUSK-CMC) creep tested at 1100 and 1200°C in air

Author： Davies I. J.   Ogasawara T.   Ishikawa T.  

Publisher： Taylor & Francis Ltd

ISSN： 1568-5519

Source： Advanced Composite Materials, Vol.10, Iss.4, 2001-12, pp. : 357-367

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