Structural characterization of bis-[triethoxysilylpropyl]tetrasulfide and bis-[trimethoxysilylpropyl]amine silanes by Fourier-transform infrared spectroscopy and electrochemical impedance spectroscopy

Author: Zhu Danqing   van Ooij Wim J.  

Publisher: Taylor & Francis Ltd

ISSN: 1568-5616

Source: Journal of Adhesion Science and Technology, Vol.16, Iss.9, 2002-09, pp. : 1235-1260

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