A time-of-flight static secondary ion mass spectrometry and X-ray photoelectron spectroscopy study of 3-aminopropyltrihydroxysilane on water plasma treated chromium and silicon surfaces

Author: Eldridge B.N.   Buchwalter L.P.   Chess C.A.   Goldberg M.J.   Goldblatt R.D.   Novak F.P.  

Publisher: Taylor & Francis Ltd

ISSN: 1568-5616

Source: Journal of Adhesion Science and Technology, Vol.6, Iss.1, 1992-01, pp. : 109-125

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