3D-FDTD characterization of an original low-loss silicon line

Author: Richardson Alexandre   Cirio Laurent   Martoglio Laurent   Picon Odile  

Publisher: Emerald Group Publishing Ltd

ISSN: 0332-1649

Source: COMPEL: Int J for Computation and Maths. in Electrical and Electronic Eng., Vol.21, Iss.4, 2002-09, pp. : 624-633

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content